We help you solve the smallest problems imaginable.
We help you solve the smallest problems imaginable.
The Custom Nanotech development team brings collective expertise in the bottom-up synthesis and top-down machining of nanoscale components. The team has co-authored 12 patents that are either issued or pending related to nanofabrication and nano-device design. By being adept with the modern tools of nanosicence, while still being experienced in the more traditional microfabrication techniques, Custom Nanotech can stay on the cutting edge. Custom Nanotech’s scientists have led process development and a wide variety of nanotechnology projects in a range of industries which include: Nano-electromechanical systems, optoelectronics, biotechnology and nanoscale-MOS devices. In addition to time spent in nanotech start-ups, the Custom Nanotech team brings industrial expertise from GE, Dupont and KLA-Tencor.
What our customers are saying:
“Custom Nanotech delivered. Period. We gave them a very tough challenge and a tight timeline and they nailed it. Bravo.”
Idea
Theory
Prototyping
Development
Manufacturing
Packaging
Wherever you are in your development cycle. We can help.
Copyright 2010 - Custom Nanotech LLC.
Keywords: nano-technology, nanotechnology, carbon nanotubes, synthesis of 1-Dimensional Nano-materials (carbon nanotubes, GaN, ZnO and Silicon nanowires), Nanostructure Manipulation, Optical lithography, Soft-Lithography, Electron Beam Lithography, Photo-Mask Fabrication, Focused Ion Beam milling/deposition (FIB), Reactive Ion Etching, Inductively Coupled Plasma, Bosch Processes, Wet Etching, Sputtering, Thermal Evaporation, E-beam Evaporation, Chemical Vapor Deposition (LPCVD), Plasma Enhanced Chemical Vapor Deposition (PECVD), Atomic Layer Deposition (ALD), Thermal Oxidation, Diffusion, Wafer Bonding, Chemical Mechanical Polishing., Scanning Electron Microscopy (SEM), Energy-Dispersive Spectrometry (EDS), X-Ray Diffraction (XRD), X-Ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), Four-Point Probe, Ellipsometry.